IEC 62899-202-11:2025
Printed electronics - Part 202-11: Materials - Conductive ink - Measurement method of electrical resistance uniformity for large area printed conductive layer
Printed electronics - Part 202-11: Materials - Conductive ink - Measurement method of electrical resistance uniformity for large area printed conductive layer
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 13
- Дата публикации:
- 23 апреля 2025 г.
- Издание:
- IEC IS 62899 edition 1 version 1
- ICS:
- 31.180
IEC 62899-202-11:2025 specifies a measurement method of electrical resistance uniformity for large area printed conductive layers. The purpose of this method is to measure resistance uniformity of planar large area printed layers. This method cannot measure sheet resistance. The methods measure electrical resistance or electrical potential drop and use direct contact.
Abstract
Overview - IEC 62899-202-11:2025 (Printed electronics, conductive ink)
IEC 62899-202-11:2025 specifies a direct-contact measurement method to evaluate electrical resistance uniformity of large area printed conductive layers. It defines test samples, environmental conditions, measurement procedures and data reporting for two complementary approaches: apparent electrical resistance tomography and electrical potential tomography. This method is intended to map resistance distribution and detect line defects in planar printed conductive films (it does not provide sheet resistance).
Key topics and technical requirements
- Scope and purpose: Measure resistance uniformity of planar large-area printed conductive layers; cannot be used to determine sheet resistance.
- Measurement approaches:
- Electrical resistance tomography - periodic direct-contact resistance measurements on a grid; useful for rapid screening and line-defect detection.
- Electrical potential tomography - measuring voltage drop under applied current; reduces contact-resistance effects for finer detail.
- Test samples and dimensions: Standard sample sizes are provided (examples: Type A ≈ 200×200 mm, Type B ≈ 300×300 mm, Type C up to 400×500 mm); alternate sizes may be agreed between trading partners.
- Electrode grid and spacing: Electrodes are placed in a grid across machine and transverse directions to the print; neighboring point resistances are compared to locate non-uniform areas.
- Environmental conditions: Standard measurement atmosphere as per IEC 62899-202 - 23 ± 2 °C and 50 ± 10 % RH.
- Direct contact requirement: Methods use direct electrical contact; contact-sensitive films may require contactless alternatives.
- Data analysis and reporting: Results are presented as tomographic maps of apparent resistance or potential drop, with standardized reporting of measured values and location-based comparisons.
Practical applications
- Detecting and mapping line defects, nozzle-clogging effects, ink agglomeration and other non-uniformities in roll-to-roll printed electronics.
- Quality screening for large-area printed devices such as printed displays, digital signage, transparent conductive coatings and other printed conductive layers.
- Process control during production (e.g., identifying zones requiring printer maintenance or ink formulation adjustment).
Who would use this standard
- Printed electronics manufacturers (roll-to-roll printers, screen and gravure printers)
- Materials suppliers (conductive ink developers and formulators)
- Test labs and quality engineers verifying large-area conductivity uniformity
- OEMs specifying acceptance criteria for printed conductive films
Related standards
- IEC 62899-202 (Printed electronics - Part 202: Materials - Conductive ink)
- IEC 62899-202-3 (contactless measurement alternatives)
- IEC TS 62607-6-9 (eddy-current methods for delicate nanomaterial films)
Keywords: IEC 62899-202-11:2025, printed electronics, conductive ink, electrical resistance uniformity, large area printed conductive layer, resistance tomography, potential tomography, roll-to-roll.
Технические детали
- Технический комитет
- TC 119 - Printed Electronics
- SKU
- IEC 62899-202-11:2025
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