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Electronic paper display - Part 2: Essential ratings and characteristics
Ferrite cores - Guidelines on the limits of surface irregularities - Part 2: RM-cores
Fire hazard testing - Part 1-21: Guidance for assessing the fire hazard of electrotechnical products - Ignitability - Summary and relevance of test methods
Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices
Polyvinyl chloride insulated cables of rated voltages up to and including 450/750 V - Part 7: Flexible cables screened and unscreened with two or more conductors and of rated voltages up to and including 300/500 V
Optical circuit boards - Part 2-1: Measurements - Optical attenuation and isolation
Exposure assessment methods for wireless power transfer systems
Fibre optic interconnecting devices and passive components - Fibre optic WDM devices - Part 1: Generic specification
Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
Plasma display panels - Part 5: Generic specification
Field Device Integration (FDI) - Part 101-2: Profiles - Foundation Fieldbus HSE
Surface cleaning appliances - Part 7: Dry-cleaning robots for household or similar use - Methods for measuring the performance
Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonlinear vibration of MEMS resonators
Audio archive system - Part 1-2 : BD disk and data migration for long-term audio data storage
Test on gases evolved during combustion of materials from cables - Part 1: Determination of the halogen acid gas content
Energy management system application program interface (EMS-API) - Part 456: Solved power system state profiles
Connectors for electronic equipment - Tests and measurements - Part 2-3: Electrical continuity and contact resistance tests - Test 2c: Contact resistance variation
Helical-scan digital video cassette recording system using 12,65 mm (0,5 in) magnetic tape - Format HD-D5 - Part 1: VTR specifications
SystemVerilog - Unified Hardware Design, Specification, and Verification Language
Test methods for the characterization of organic transistor-based ring oscillators