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Vulcanized fibre for electrical purposes - Part 2: Methods of test
Industrial-process control valves - Part 3-3: Dimensions End-to-end dimensions for buttweld, two-way, globe-type, straight pattern control valves
Connectors for electronic equipment - Tests and measurements - Part 12-3: Soldering tests - Test 12c: Solderability, de-wetting
Metal thermowells for thermometer sensors - Functional dimensions
Connecting devices for low-voltage circuits for household and similar purposes - Part 2-4: Particular requirements for twist-on connecting devices
Eyewear display - Part 400-20: Introduction to sensing functions - 3D sensing
Economic evaluation of active assisted living services - Part 1: Framework
Medical devices — Part 2: Guidance on the application of usability engineering to medical devices
Fibre optic interconnecting devices and passive components - Performance standard - Part 056-2: Single mode fibre pigtailed style optical fuse for category C - Controlled environment
Field device tool (FDT) interface specification – Part 71: OPC UA Information Model for FDT
Fire performance of communication cables installed in buildings
Thermistors - Directly heated positive step-function temperature coefficient - Part 1-3: Blank detail specification - Inrush current application - Assessment level EZ
Test methods for electrical materials, printed boards and other interconnection structures and assemblies - Part 3: Test methods for interconnection structures (printed boards)
Nanomanufacturing - Large scale manufacturing for nanoelectronics
Arc welding equipment - Part 13: Welding clamp
Electrical insulating materials - Determination of the effects of ionizing radiation - Part 5: Procedures for assessment of ageing in service
Graphite electrodes for electric arc furnaces - Dimensions and designation
Radio interference test on high-voltage insulators
Evaluation of human exposure to electromagnetic fields from short range devices (SRDs) in various applications over the frequency range 0 GHz to 300 GHz - Part 1: Fields produced by devices used for electronic article s…
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation