Найдено: 2
Overview IEC 60749-28:2022 is the international standard for device-level Charged Device Model (CDM) electrostatic discharge (ESD) sensitivity testing of semiconductor devices. It defines the field‑i…
Overview IEC 60749-28:2017 - "Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level" de…