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Overview IEC 62047-29:2017 specifies an electromechanical relaxation test method for freestanding conductive thin films under room temperature. The standard defines how to measure time-dependent elec…
Overview IEC 62047-28:2017 defines a performance testing method for vibration‑driven MEMS electret energy harvesting devices. The standard specifies terms, test equipment, measurement procedures and…
Overview The IEC 62047-2:2006 standard, published by the International Electrotechnical Commission (IEC), specifies the method for tensile testing of thin film materials used primarily in micro-elect…
Overview IEC 62047-25:2016 is an international standard published by the International Electrotechnical Commission (IEC), focused on semiconductor devices and, specifically, micro-electromechanical s…
Overview IEC 62047-21:2014 is an international standard published by the International Electrotechnical Commission (IEC) that specifies a precise test method for determining Poisson's ratio of thin f…
Overview IEC 62047-22:2014 is an international standard developed by the International Electrotechnical Commission (IEC) that specifies an electromechanical tensile test method for conductive thin fi…
IEC 62047-26:2016 Overview IEC 62047-26:2016 is an international standard published by the International Electrotechnical Commission (IEC) that focuses on semiconductor devices and micro-electromecha…
Overview - IEC 62047-27:2017 (micro-chevron-test for glass frit bonds) IEC 62047-27:2017 specifies a standardized method to assess bond strength of glass frit bonded structures using the micro-chevro…
Overview IEC 62047-20:2014 is an international standard developed by the International Electrotechnical Commission (IEC) focusing on semiconductor micro-electromechanical systems (MEMS), specifically…
What is BS IEC 62047 ‑ 28 - Vibration-driven MEMS for energy harvesting devices ? BS IEC 62047 is an international standard that discusses semiconductor devices including microelectromechanical devic…
What is BS IEC 62047 ‑ 27 - Micro-chevron-tests (MCT) for semiconductor devices about? BS IEC 62047 is an international standard that discusses semiconductor devices including microelectromechanical…
What is BS IEC 62047 ‑ 29 - Electromechanical relaxation test method for MEMS ? BS IEC 62047 is an international standard that discusses semiconductor devices including microelectromechanical devices…