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Overview ISO 20263:2017 - Microbeam analysis - Analytical electron microscopy - Method for the determination of interface position in the cross-sectional image of the layered materials - defines a st…
Overview - ISO 20263:2024 (Microbeam analysis, Analytical electron microscopy) ISO 20263:2024 specifies a standardized procedure to determine the averaged interface position between two layered mater…
1 Scope This document specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered mat…