IEC 61215-1-3:2021

Overview - IEC 61215-1-3:2021 (thin-film a‑Si PV modules)

IEC 61215-1-3:2021 is a technology-specific part of the IEC 61215 series that defines design qualification and type approval requirements for terrestrial flat‑plate photovoltaic (PV) modules based on thin‑film amorphous silicon (a‑Si; a‑Si/µc‑Si). It supplements the general procedures in IEC 61215-1:2021 and IEC 61215-2:2021, describing special test modifications and additional module‑level tests needed to evaluate long‑term performance in open‑air climates. This second edition (2021) replaces the 2016 edition and introduces new mechanical and degradation tests while clarifying stabilization procedures for thin‑film modules.

Key topics and technical requirements

• Scope: Applies to terrestrial thin‑film a‑Si flat plate modules; excludes high‑concentration systems (low concentration 1–3 suns may be accommodated with adjusted test conditions).
• Design qualification objective: Use accelerated tests to reveal failure modes and verify module robustness; test results are not a quantitative lifetime prediction.
• Test flow and MQT procedures: Adapts standard IEC MQT sequence (visual inspection, maximum power, insulation, temperature coefficients, STC/NMOT performance, low irradiance, outdoor exposure, UV, thermal cycling, damp heat, humidity‑freeze, hot‑spot, hail, bypass diode, stabilization, etc.) with thin‑film‑specific requirements.
• New and notable tests (Edition 2.0):
  • MQT 20 - Cyclic (dynamic) mechanical load test: evaluates fatigue under repeated mechanical loading.
  • MQT 21 - Potential‑Induced Degradation (PID) detection test: screens thin‑film modules for susceptibility to PID.
  • MQT 22 - Bending test: introduced for flexible thin‑film modules.
• Stabilization (MQT 19): Special procedures for stabilizing output of a‑Si modules prior to key measurements.
• Pass criteria & reporting: Pass/fail rules follow IEC 61215-1 with technology adjustments; detailed reporting and documentation requirements are specified.

Applications and who uses it

This standard is used by:

• PV module manufacturers (product development, type approval)
• Independent test laboratories and certification bodies (qualification testing, compliance)
• Procurement teams and system integrators (specification and acceptance testing)
• R&D and reliability engineers evaluating thin‑film a‑Si durability and failure modes

Practical uses include qualifying modules for warranties, validating new flexible thin‑film designs, screening for PID susceptibility, and verifying mechanical fatigue resistance in field‑like conditions.

Related standards and references

• IEC 61215-1:2021 and IEC 61215-2:2021 (general design qualification and test methods)
• IEC 60721-2-1 (climate classification)
• IEC 62506 (accelerated test methods overview)
• IEC TS 63126 (high‑temperature test considerations)
• IEC 62941 (quality systems in PV manufacturing)
• IEC 63163 (consumer electronics PV testing - under development)

Keywords: IEC 61215-1-3:2021, thin‑film amorphous silicon, a‑Si PV modules, PV module testing, design qualification, type approval, PID, cyclic mechanical load test, bending test, accelerated durability testing.