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Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND)

Overview IEC 60749-16:2003 is an international standard that specifies a non-destructive mechanical and climatic test method called Particle Impact Noise Detection (PIND). This test targets the detec…

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Overview IEC 60749-17:2019 is an international standard developed by the International Electrotechnical Commission (IEC) that specifies test methods for evaluating the neutron irradiation effects on…

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Overview IEC 60749-13:2018 is an international standard published by the International Electrotechnical Commission (IEC) that specifies mechanical and climatic test methods for semiconductor devices…

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Overview IEC 60749-12:2017 is an international standard published by the International Electrotechnical Commission (IEC) that specifies mechanical test methods for semiconductor devices, focusing on…

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

Overview IEC 60749-17:2003 is an international standard issued by the International Electrotechnical Commission (IEC) that defines mechanical and climatic test methods for semiconductor devices, focu…

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

Overview IEC 60749-18:2002 is an international standard published by the International Electrotechnical Commission (IEC) that specifies test methods for evaluating the effects of ionizing radiation (…

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead inte…

Overview IEC 60749-14:2003 is an international standard developed by the International Electrotechnical Commission (IEC) for testing the robustness and lead integrity of semiconductor device terminat…

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature f…

Overview IEC 60749-15:2020 - Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through‑hole mounted devices - defines a reproducible sold…

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

Overview IEC 60749-18:2019 - "Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)" defines test procedures for characterizing packaged semiconducto…

Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature f…

Overview IEC 60749-15:2010 is an international standard published by the International Electrotechnical Commission (IEC) that specifies mechanical and climatic test methods to evaluate the resistance…

Semiconductor devices - Mechanical and climatic test methods - Part 1: General

Overview IEC 60749-1:2002 is an international standard published by the International Electrotechnical Commission (IEC) focusing on semiconductor devices. This standard provides the general provision…

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subasse…

Overview IEC 60749-10:2022 is an internationally recognized standard that outlines mechanical shock test methods for semiconductor devices and subassemblies. Issued by the International Electrotechni…

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-flu…

Overview IEC 60749-11:2002 is an international standard developed by the International Electrotechnical Commission (IEC) that specifies the test method for rapid change of temperature on semiconducto…

Semiconductor devices. Mechanical and climatic test methods - Salt atmosphere

What is BS EN IEC 60749-13 – Salt atmosphere test for semiconductor devices about? BS EN IEC 60749 is an international standard on semiconductor devices. BS EN IEC 60749-13 is the 13 th part of the s…

Semiconductor devices. Mechanical and climatic test methods - Ionizing radiation (total dose)

Semiconductor devices. Mechanical and climatic test methods - Vibration, variable frequency

What is BS EN IEC 60749-12 - Variable frequency vibration of semiconductor devices about? BS EN IEC 60749 is an international standard on semiconductor devices. BS EN IEC 60749-12 is the 12th part in…

Semiconductor devices. Mechanical and climatic test methods - Resistance to soldering temperature for through…

What is BS EN IEC 60749 ‑ 15 about? BS EN IEC 60749 ‑ 15 is the 15th part of Semiconductor devices in multi-series. BS EN IEC 60749 ‑ 15 describes a test used to determine whether encapsulated solid…

Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation

What is BS EN IEC 60749 ‑ 17 about? BS EN IEC 60749 ‑ 17 is the 17th part of an international standard that covers the attributes of semiconductor devices. This specifies the neutron irradiation test…